NCRA-SIRC

Your cart is empty.

Scientific Information Resource Centre, NCRA-TIFR

Normal view MARC view ISBD view

Digital systems testing and testable design /

by Abramovici, Miron.
Additional authors: Breuer, Melvin A. | Friedman, Arthur D.
Edition statement:Rev. print. Published by : IEEE Press, (New York :) Physical details: xviii, 652 p. : ill. ; 27 cm. ISBN:9780780310629.
Subject(s): Digital integrated circuits -- Testing. | Digital integrated circuits -- Design and construction.
Year: 1990
Online resources:
Tags from this library: No tags from this library for this title. Log in to add tags.
Item type Current location Call number Status Date due Barcode
Books Books Giant Metrewave Radio Telescope
General Stacks 		Available 13694

Includes bibliographical references and index.

There are no comments for this item.

Log in to your account to post a comment.