Abramovici, Miron.
Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. - Rev. print. - New York : IEEE Press, [1994], c1990. - xviii, 652 p. : ill. ; 27 cm.
Includes bibliographical references and index.
9780780310629
94233953
Digital integrated circuits--Testing.
Digital integrated circuits--Design and construction.
TK7874 / .A23 1990b
Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. - Rev. print. - New York : IEEE Press, [1994], c1990. - xviii, 652 p. : ill. ; 27 cm.
Includes bibliographical references and index.
9780780310629
94233953
Digital integrated circuits--Testing.
Digital integrated circuits--Design and construction.
TK7874 / .A23 1990b