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Built-in test for VLSI :

Additional authors: McAnney, William H. | Savir, Jacob.

Published by : Wiley, (New York :) Physical details: xiii, 354 p. : ill. ; 24 cm. ISBN:0471624632.

Subject(s): Integrated circuits -- Very large scale integration -- Testing.

Year: 1987

Online resources:

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Item type	Current location	Call number	Copy number	Status	Date due	Barcode
Books	National Centre for Radio Astrophysics Welcome to NCRA- WEB OPAC General Stacks	621.3.049.77/BAR (Browse shelf)	1707	Available		1707

"A Wiley-Interscience publication."

Includes index.

Bibliography: p. 339-345.

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