Bardell, Paul H.
Built-in test for VLSI : pseudorandom techniques / Paul H. Bardell, William H. McAnney, Jacob Savir. - New York : Wiley, c1987. - xiii, 354 p. : ill. ; 24 cm.
"A Wiley-Interscience publication." Includes index.
Bibliography: p. 339-345.
0471624632
87023013
Integrated circuits--Very large scale integration--Testing.
TK7874 / .B374 1987
621.381/73
Built-in test for VLSI : pseudorandom techniques / Paul H. Bardell, William H. McAnney, Jacob Savir. - New York : Wiley, c1987. - xiii, 354 p. : ill. ; 24 cm.
"A Wiley-Interscience publication." Includes index.
Bibliography: p. 339-345.
0471624632
87023013
Integrated circuits--Very large scale integration--Testing.
TK7874 / .B374 1987
621.381/73