High-level test synthesis of digital VLSI circuits /
by Lee, Mike Tien-Chien.
Published by : Artech House, (Boston :) Physical details: xi, 220 p. : ill. ; 24 cm. ISBN:0890069077 (alk. paper).
Subject(s):
Integrated circuits
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Very large scale integration
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Computer-aided design.
|
Integrated circuits
--
Very large scale integration
--
Testing
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Data processing
|
Digital integrated circuits
--
Testing
--
Data processing.
Year: 1997
|
Integrated circuits
--
Very large scale integration
--
Testing
--
Data processing
|
Digital integrated circuits
--
Testing
--
Data processing.
| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
|---|---|---|---|---|---|---|
Books
|
National Centre for Radio Astrophysics
Welcome to NCRA- WEB OPAC |
621.3.049.77/LEE (Browse shelf) | 10209 | Available | 10209 |
Includes bibliographical references (p. 199-214) and index.
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