Scientific Information Resource Centre, NCRA-TIFR

Lee, Mike Tien-Chien.

High-level test synthesis of digital VLSI circuits / Mike Tien-Chien Lee. - Boston : Artech House, 1997. - xi, 220 p. : ill. ; 24 cm.

Includes bibliographical references (p. 199-214) and index.

0890069077 (alk. paper)

96006584


Integrated circuits--Very large scale integration--Computer-aided design.
Integrated circuits--Very large scale integration--Testing--Data processing
Digital integrated circuits--Testing--Data processing.

TK7874.75 / .L44 1997

621.39/5