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Built-in test for VLSI :

Additional authors: McAnney, William H. | Savir, Jacob.

Published by : Wiley, (New York :) Physical details: xiii, 354 p. : ill. ; 24 cm. ISBN:0471624632.

Subject(s): Integrated circuits -- Very large scale integration -- Testing.

Year: 1987

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Item type	Current location	Call number	Copy number	Status	Date due	Barcode
Books	National Centre for Radio Astrophysics Welcome to NCRA- WEB OPAC General Stacks	621.3.049.77/BAR (Browse shelf)	1707	Available		1707

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Previous	621.3.049.774/LAD MMIC design :	621.3.049.774/MIL Integrated electronics :	621.3.049.774/VEN Microwave circuit design using linear and nonlinear techniques /	621.3.049.77/BAR Built-in test for VLSI :	621.3.049.77/BUR Integrated circuits data book.	621.3.049.77/FIT Electronic integrated circuits and systems	621.3.049.77/HER Design of VLSI circuits based on VENUS /	Next