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Advanced production testing of RF, SoC, and SiP devices /

Additional authors: Engelhardt, Michael.

Published by : Artech House, (Boston :) Physical details: xx, 301 p. : ill. ; 24 cm. ISBN:158053709X; 9781580537094.

Subject(s): Systems on a chip -- Testing.

Year: 2007

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Item type	Current location	Call number	Copy number	Status	Date due	Barcode
Books	Giant Metrewave Radio Telescope General Stacks	621.382/KEL (Browse shelf)	13153	Available		13153

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