Scientific Information Resource Centre, NCRA-TIFR

Kelly, Joe.

Advanced production testing of RF, SoC, and SiP devices / Joe Kelly, Michael Engelhardt. - Boston : Artech House, 2007. - xx, 301 p. : ill. ; 24 cm.

Includes bibliographical references and index.

158053709X 9781580537094

2007272451

GBA6A5163 bnb

013614722 Uk


Systems on a chip--Testing.

TK7895.E42 / K45 2007

621.3815