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Scientific Information Resource Centre, NCRA-TIFR

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1.
Built-in test for VLSI : by Bardell, Paul H. Publication: New York : Wiley, 1987 . xiii, 354 p. : , "A Wiley-Interscience publication." | Includes index. 24 cm. Date: 1987 Availability: Items available: National Centre for Radio Astrophysics General Stacks [621.3.049.77/BAR] (1),
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2.
Introduction to VLSI testing / by Feugate, Robert J., Publication: Englewood Cliffs, N.J. : Prentice Hall, 1988 . xiii, 226 p. : 24 cm. Date: 1988 Availability: Items available: National Centre for Radio Astrophysics General Stacks [621.3.049.771.14/FEU] (1),
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3.
High-level test synthesis of digital VLSI circuits / by Lee, Mike Tien-Chien. Publication: Boston : Artech House, 1997 . xi, 220 p. : 24 cm. Date: 1997 Availability: Items available: National Centre for Radio Astrophysics General Stacks [621.3.049.77/LEE] (1),
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4.
Digital hardware testing : by Rajsuman, Rochit. Publication: Boston : Artech House, 1992 . xv, 317 p. : , "Annotated bibliography": p. 303-310. 24 cm. Date: 1992 Availability: Items available: National Centre for Radio Astrophysics General Stacks [621.3.049.77/RAJ] (1),
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