NCRA-SIRC Search for 'su:Integrated circuits and su:Very large scale integration and su:Testing'

Built-in test for VLSI :

By Bardell, Paul H.. New York : Wiley, 1987 . xiii, 354 p. : , "A Wiley-Interscience publication." | Includes index. 24 cm.. 0471624632

By Feugate, Robert J.,. Englewood Cliffs, N.J. : Prentice Hall, 1988 . xiii, 226 p. : 24 cm.. 0134988663 :

By Lee, Mike Tien-Chien.. Boston : Artech House, 1997 . xi, 220 p. : 24 cm.. 0890069077 (alk. paper)

By Rajsuman, Rochit.. Boston : Artech House, 1992 . xv, 317 p. : , "Annotated bibliography": p. 303-310. 24 cm.. 0890065802