TY  - BOOK
AU  - Bonani,Fabrizio
AU  - Ghione,Giovanni
TI  - Noise in semiconductor devices: modeling and simulation 
SN  - 3540665838 (alk. paper)
AV  - TK7867.5 .B65 2001
U1  - 621.3815/2 21
PY  - 2001///
CY  - New York
PB  - Springer
KW  - Electronic noise
KW  - Mathematical models
KW  - Integrated circuits
KW  - Simulation methods
KW  - Semiconductors
N1  - Includes bibliographical references (p. [201]-208) and index
UR  - http://www.loc.gov/catdir/enhancements/fy0815/2001042017-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy0815/2001042017-t.html
ER  -