TY  - BOOK
AU  - Bardell,Paul H.
AU  - McAnney,William H.
AU  - Savir,Jacob
TI  - Built-in test for VLSI: pseudorandom techniques 
SN  - 0471624632
AV  - TK7874 .B374 1987
U1  - 621.381/73 19
PY  - 1987///
CY  - New York
PB  - Wiley
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
N1  - "A Wiley-Interscience publication."; Includes index; Bibliography: p. 339-345
UR  - http://www.loc.gov/catdir/description/wiley033/87023013.html
UR  - http://www.loc.gov/catdir/toc/onix04/87023013.html
ER  -