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Test economics and design for testability for electronic circuits and systems /

Additional authors: Dislis, C. -- (Chryssa)

Series: Ellis Horwood series in electrical and electronic engineering Published by : Ellis Horwood, (New York :) Physical details: x, 206 p. : ill. ; 25 cm. ISBN:0131089943.

Subject(s): Electronic circuits -- Testing. | Electronic circuit design -- Economic aspects.

Year: 1995

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Item type	Current location	Call number	Copy number	Status	Date due	Barcode
Books	National Centre for Radio Astrophysics Welcome to NCRA- WEB OPAC General Stacks	621.3.049.771.14/DIS (Browse shelf)	10301	Available		10301

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Previous	621.3.049.77 ELE Data sheet book :linear TTL CMOS	621.3.049.77/ GUP Microwave integrated circuits /	621.3.049.77(035)/HOF Handbook of microwave integrated circuits /	621.3.049.771.14/DIS Test economics and design for testability for electronic circuits and systems /	621.3.049.771.14/FEU Introduction to VLSI testing /	621.3.049.771.14/HOL Design of VLSI gate array ICs /	621.3.049.771.14/MEA Introduction to VLSI systems /	Next