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Introduction to VLSI testing /

Additional authors: McIntyre, Steven M., -- 1958-

Published by : Prentice Hall, (Englewood Cliffs, N.J. :) Physical details: xiii, 226 p. : ill. ; 24 cm. ISBN:0134988663 :.

Subject(s): Integrated circuits -- Very large scale integration -- Testing.

Year: 1988

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Item type	Current location	Call number	Copy number	Status	Date due	Barcode
Books	National Centre for Radio Astrophysics Welcome to NCRA- WEB OPAC General Stacks	621.3.049.771.14/FEU (Browse shelf)	1779	Available		1779

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Previous	621.3.049.77/ GUP Microwave integrated circuits /	621.3.049.77(035)/HOF Handbook of microwave integrated circuits /	621.3.049.771.14/DIS Test economics and design for testability for electronic circuits and systems /	621.3.049.771.14/FEU Introduction to VLSI testing /	621.3.049.771.14/HOL Design of VLSI gate array ICs /	621.3.049.771.14/MEA Introduction to VLSI systems /	621.3.049.771.14/MUK Introduction to nMOS and CMOS VLSI systems design /	Next